PATRUCCO - Laboratori didattici per l'elettronica

The KL-300 Digital Logic Lab is a comprehensive and self-contained system suitable for anyone engaged in digital logic experiments. All necessary equipments for digital logic experiments such as power supply, signal generator, switches and displays are installed on the main unit. The 13 modules covers a wide variety of essential topics in the field of digital logic. It is a time and cost saving device for both students and researchers interested in developing and testing circuit prototypes.

FEATURES

a Suitable for combined logic, sequential logic and microprocessor circuits designing and experiments.

a Ideal tool for learning the basics of digital logic circuits.

a Comprehensive power, signal supply and testing devices for convenient experiments.

a Expandability and flexibility of experiments greatly increased with universal breadboard.

a Capable of processing TTL, CMOS. NMOS, PMOS and ELC circuits.

a All supply units are equipped with overload protection for better safety.

a All modules equipped with 8-bit DIP switch for fault simulations.

a Individual storage cases for all modules for easy storing and carrying.

TYPE OF EXPERIMENTS

a Basic Logic Gates Experiments

a Combinational Logic Circuits Experiments

a Clock Generator Circuit Experiments

a Sequential Logic Circuit Experiments

a Memory Circuit Experiments

a Converter Circuit Experiment

THE KL-300 MAIN UNIT

The main unit incorporates all necessary equipment for use with the thirteen plug-on training modules. Power supply, signal generator, and a wide range of logic switches and indicators are all built-in.

The DC power supply provides fixed +5V at 1.5A, -5V at 0.3A, ±12V at 0.3A, and a variable ±1.5V ~ ±15V at 0.5A.

The signal generator provides clock signals from 1Hz to 1MHz in 6 ranges.

The main unit is also supplied with a removable 1680 tie point universal breadboard for general experimentation and prototyping.

KL-300 EXPERIMENTS MODULES

13 modules form the basis for over 60 experiments detailed in the comprehensive experiment manual. Each module contains the experiment circuit which is clearly illustrated by a cicuit diagram on its top panel. Switch faults are also incorporated into the modules for simulating fault situations.

1. KL-33001 Basic Logic Gates Experiment Module

2. KL-33002 Assembled Logic Circuits (1) Experiment Module

3. KL-33003 Assembled Logic Circuits (2) Experiment Module

4. KL-33004 Assembled Logic Circuits (3) Experiment Module

5. KL-33005 Assembled Logic Circuits (4) Experiment Module

6. KL-33006 Assembled Logic Circuits (5) Experiment Module

7. KL-33007 Clock Generator Circuit Experiment Module

8. KL-33008 Sequential Logic Circuits (1) Experiment Module

9. KL-33009 Sequential Logic Circuits (2) Experiment Module

10. KL-33010 Memory Circuits (1) Experiment Module

11. KL-33011 Memory Circuits (2) Experiment Module

12. KL-33012 Converter Circuit Experiments (1)

13. KL-33013 Converter Circuit Experiments (2)

LIST OF EXPERIMENTS

The full list of experiments performed using the above modules and detailed in the experiment manual are:

Basic Logic Gates Experiments
1. Introduction to logic and switches
2. Logic gates circuit experiments
  a. Diode Logic (DL) circuit
  b. Resistor-Transistor Logic (RTL) circuit
  c. Diode-Transistor Logic (DTL) circuit
  d. Transistor-Transistor Logic (TTL) circuit
  e. CMOS Logic circuit
3. Threshold Voltage measurement experiments
  a. TTL logic circuit
  b. CMOS logic circuit
4. Voltage/current measurement experiments
  a. TTL I/O Voltage/current output measurement
  b. CMOS I/O Voltage/current output measurement
5. Basic logic gate transmission delay measurements
  a. TTL logic gate transmission delay measurements
  b. Schmitt gate transmission delay measurements
  c. CMOS logic gate transmission delay measurements
6. Basic logic gate characteristics
  a. AND gate characterisitics
  b. OR gate characterisitics
  c. NOT gate characteristics
  d. NAND gate characterisitics
  e. NOR gate characteristics
  f. XOR gate characteristics
7. Interfacing between logic gates
  a. TTL to CMOS interface
  b. CMOS to TTL interface
Assembled Logic Circuits Experiments
1. NOR gate circuit experiment
2. NAND gate circuit experiment
3. XOR gate circuit experiment
  a. with NAND gate
  b. with basic equations
4. A-0-1 gate circuit experiment
5. Comparator circuit experiments
  a. with basic logic gates
  b. with TTL comparator IC
6. Schmitt gate circuit experiment
7. Open collector gate circuit experiment
  a. High Voltage/current driver circuit
  b. Constructing an AND gate with open collector gate
8. Three-state gate circuit experiments
  a. Truth table experiment
  b. Constructing an AND gate with three-state gate
  c. Bidirectional transmission circuit
9. Half adder and full adder experiments
  a. with basic logic gates
  b. Full adder circuit
  c. High-speed adder carrier generator
  d. BCD code adder circuit
10. Half subtractor and full subtractor experiments
  a. with basic logic gates
  b. with full adder and inverter circuit
11. Arithmetic Logic Unit (ALU) circuit experiment
12. Bit parity generator experiments
  a. with XOR gate
  b. with bit parity generator IC
13. Encoder circuit experiments
  a. Constructing a 4 to 2-bit encoder with basic logic gates
  b. Constructing a 10 to 4-bit encoder with TTL IC
14. Decoder circuit experiments
  a. Constructing a 4 to 2-bit decoder with basic logic gates
  b. Constructing a 10 to 4-bit decoder with TTL IC
  c. Decoding a 7-segment display with BCD code
15. Multiplexer circuit experiments
  a. Constructing a 2 to 1-bit multiplexer with basic logic gates
  b. Using a multiplexer to create functions
  c. Constructing an 8 to 1-bit multiplexer with TTL IC
16. Demultiplexer circuit experiments
  a. Constructing a 1 to 2-bit demultiplexer with basic logic gates
  b. Constructing a 1 to 8-bit demultiplexer with CMOS IC
17. Digitally controlled analogue multiplexer/demultiplexer circuits
  a. Characteristics of analogue switches
  b. Bidirectional transmission with CMOS IC analogue switches
Clock Generator Circuit Experiments
1. Constructing an oscillator circuit with basic logic gates
2. Constructing an oscillator circuit with Schmitt gate
3. Voltage Controlled Oscillator (VCO) circuit
4. 555 IC oscillator circuit experiments
  a. 555 oscillator circuit
  b. Voltage controlled oscillator circuit
5. Monostable multivibrator circuit experiments
  a. Low-speed monostable multivibrator cicuits
  a-1. Non-retriggerable circuit
  a-2. Retriggerable circuit
  b. High-speed monostable multivibrator cicuits
  b-1. Non-retriggerable circuit
  b-2. Retriggerable circuit
  c. Constructing a monostable multivibrator with 555 trigger
  d. Constructing a non-retriggerable circuit with TTL IC
  e. Constructing a retriggerable circuit with TTL IC
  f. Constructing a variable duty cycle oscillator circuit with monostable multivibrator
Sequential Logic Circuits Experiments
1. Constructing an R-S flip-flop with basic logic gates
2. Constructing a D flip-flop with an R-S flip-flop
3. Constructing a T flip-flop with a D flip-flop
4. Constructing a J-K flip-flop with an R-S flip-flop
5. Constructing a shift register with a D flip-flop
  a. Serial-in serial-out shift register
  b. Serial-in parallel-out shift register
  c. Parallel-in serial-out shift register
  d. Parallel-in parallel-out shift register
6. Preset left/right shift register circuit experiment
7. Noise elimination circuit with R-S flip-flop
8. Constructing counters with J-K flip-flop
  a. Assynchronous binary up-counter circuit
  b. Assynchronous decimal up-counter circuit
  c. Assynchronous divide-by-N up-counter circuit
  d. Assynchronous binary down-counter circuit
  e. Synchronous binary up-counter circuit
  f. Synchronous binary up/down counter circuit
  g. Preset synchronous binary up/down counter circuit
  h. Preset synchronous decimal up/down counter circuit
  i. Ring counter circuit
  j. Johnson's counter circuit
Memory Circuit Experiments
1. Constructing Read Only Memory (ROM) with diodes
2. Constructing Random Access Memory (RAM) with D flip-flops
3. 64-bit RAM circuit
4. Erasable Programmable Read Only Memory (EPROM) circuit
5. Electronically Erasable Programmable Read Only Memory (EEPROM) circuit
6. Constructing a dynamic scanning counter with a single-chip microprocessor
Converter Circuits Experiments
1. Digital to analogue (D/A) converter circuit experiments
  a. Unipolar output converter circuit
  b. Bipolar output converter circuit
2. Analogue to digital (A/D) converter circuit experiments
  a. 8-bit converter circuit
  b. 3½-digit convertor circuit
Circuit Application Experiments
1. 4-channel trigger selector
2. Tone-adjustable electronic organ
3. Level indicator
4. Monostable coded lock
5. Depth monitor
6. Electronic stopwatch
7. Flashing light with metronome
8. Entrance/exit counter
9. Multiple switches
10. Electronic clock
11. Frequency counter
12. Telephone ring generator

SPECIFICATIONS

KL-300 Main Unit
Fixed DC Power Supply	Voltage range: +5V, -5V, +12V and -12V Maximum current output: 1.5A for +5V rail, 300mA for others Output overload protection
Variable DC Power Supply	Voltage range: +1.5V ~ +15V, -1.5V ~ -15V Maximum current output: 0.5A Output overload protection
Variable Clock Generator	Six frequency ranges: 1Hz to 10Hz 10Hz to 100Hz 100Hz to 1kHz 1kHz to 10kHz 10kHz to 100kHz 100kHz to 1MHz Output level: independent and simultaneous TTL and CMOS, CMOS output range adjustable from +1.5V to +15V Fanout: 10 TTL loads
Preset Frequency Generator	Preset frequencies: 1Hz 50/60Hz 1MHz Output level: independent and simultaneous TTL and CMOS, CMOS output range adjustable from +1.5V to +15V Fanout: 10 TTL loads
Line Signal Generator	50/60Hz Output Voltage: 6V rms
Data Switches	Two 8-bit DIP switches giving 16-bit TTL level output Four toggle switches, each with debounce circuit, TTL and CMOS outputs Fanout: 10 TTL loads
Pulser Switches	Two sets, each having debounced TTL and CMOS, Q and /Q outputs Fanout: 10 TTL loads
Thumbwheel Switches	Two-digit, BCD code output, common point input
Logic Indicators	16 sets of independent LEDs, indicating high and low logic states Input impedance: <100kW
Seven-Segment Displays	Four sets of independent 7-segment displays, with BCD, 7-segment decoder/driver and decimal point input terminal, input with 8-4-2-1 code
Logic Probe	TTL and CMOS level, 3mm LED displays indicate high and low logic states
Speaker	8W, 0.25W speaker with driver circuit
Removable Solderless Breadboard	1680 interconnected tie points, accepting all DIP devices, components with leads and solid wires of AWG #22-30 (0.3mm to 0.8mm)
Accessories	Power lead, connecting leads, fuse, dust cover, and user manual
Power Supply	110/220V AC ±10% 50/60Hz
Physical Characteristics	Dimensions: 400mm (width), 300mm (depth), 130mm (height) Weight: 5kg

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